Oxidation of Nickel
Nickel is an ideal metal for oxidation studies due to forming a single oxide, NiO (a p-type semiconductor with cation deficit), with oxidation occurring via the outward migration of cations and electrons. Impurities increase the oxidation rate, though the activation energy remains constant. The morphology of the oxide layer depends on nickel purity; high purity results in a compact, adherent layer.
Role of Platinum as a Marker
Platinum markers, found at the interface between the compact and porous NiO layers post-oxidation, indicate that the outer layer grows by outward cation migration and the inner layer by inward oxygen migration.
Effect of Nickel Condition
Cold-worked nickel oxidizes faster than annealed nickel, showing lower activation energy due to easier diffusion paths along oxide grain boundaries.
Dependence on Oxygen Pressure
The oxidation rate increases with higher oxygen partial pressure, linked to cation vacancies (V′Ni) that vary with the 1/6 power of oxygen pressure per Equation 4.3.
Role of Defects
Point defects (e.g., vacancies) play a key role in oxide layer growth, with intrinsic defects possibly contributing to the overall mechanism.
Layer Separation Mechanism
If oxide plasticity is insufficient (especially in impure nickel with high oxidation rates), the layer separates from the metal, increasing oxygen activity at the inner surface, leading to layer decomposition and new oxide formation.
Effect of Temperature
At 1000°C, high-purity nickel forms a single compact NiO layer, while impurities can produce a dual-layer (compact and porous) structure.
Oxygen Partial Pressure (Fueki and Wagner Study)
Oxygen partial pressure significantly increases the oxidation rate, as demonstrated in comprehensive studies by Fueki and Wagner.
Oxidation of Zinc
Formation of ZnO Layer
When pure zinc (Zn) is oxidized, it forms only one oxide, ZnO, which is an n-type cation-excess semiconductor. This characteristic enables the creation of a single-phase, single-layered scale, making it significant for oxidation studies.
Oxidation Mechanism
The oxidation process of ZnO occurs through the presence of interstitial zinc ions and electrons. These ions and electrons play a primary role in the growth of the oxide layer and facilitate material transport within the structure.
Sensitivity to Atmospheric Pressure
The concentration gradient of defects in the scale is sensitive to oxygen partial pressure, but the overall oxidation rate is less dependent on atmospheric pressure variations, as the internal equilibrium of the system maintains relative stability.
Oxidation of Aluminum
Stable Oxide (α-Al₂O₃)
The primary oxide of aluminum, α-Al₂O₃, has a rhombohedral structure characterized by a hexagonal packing of oxide anions and cations occupying two-thirds of the octahedral sites. This oxide grows slowly and serves as a protective layer on high-temperature-resistant alloys and coatings.
Metastable Forms
Besides α-Al₂O₃, metastable forms such as γ-Al₂O₃ (cubic spinel), δ-Al₂O₃ (tetragonal), and θ-Al₂O₃ (monoclinic) exist, forming under specific conditions.
Initial Layer at Room Temperature
Aluminum is covered at ambient temperature with a thin amorphous alumina layer (2 to 3 nanometers) that forms naturally in air.
Oxidation Kinetics (Behavior by Temperature)
Below 350°C: The amorphous layer grows with inverse logarithmic kinetics.
350 to 425°C: Growth follows parabolic kinetics.
Above 425°C: Kinetics become complex and less predictable.